| Data |
Photo |
Part No. |
Manufacturer |
Description |
Operate |
|
|
MC14008BCPG |
ON Semiconductor |
IC FULL ADDER 4BIT P/N 16-DIP |
Consult |
|
|
|
MC14007UBD |
ON Semiconductor |
IC COMP DUAL PAIR W/INV 14-SOIC |
Consult |
|
|
|
SN74AS181ANT |
Texas Instruments(TI ) |
IC ARITHMETIC LOGIC UNIT 24DIP |
Consult |
|
|
|
MC14490FG |
ON Semiconductor |
IC BOUNCE ELIMINATOR 16SOEIAJ |
Consult |
|
|
|
SN74AS181ADWR |
Texas Instruments(TI ) |
IC ARITHMETIC LOGIC UNIT 24-SOIC |
Consult |
|
|
|
SN74AS181ADWRE4 |
Texas Instruments(TI ) |
IC ARITHMETIC LOGIC UNIT 24-SOIC |
Consult |
|
|
|
SN74BCT8244ANT |
Texas Instruments(TI ) |
IC SCAN TEST DEVICE BUFF 24-DIP |
Consult |
|
|
|
SN74BCT8240ANT |
Texas Instruments(TI ) |
IC SCAN TEST DEVICE BUFF 24-DIP |
Consult |
|
|
|
SN74BCT8374ANT |
Texas Instruments(TI ) |
IC SCAN TEST DEVICE W/FF 24-DIP |
Consult |
|
|
|
SN74F283NSR |
Texas Instruments(TI ) |
IC FULL ADDER 4BIT BIN 16SO |
Consult |
|
|
|
SN74F283DR |
Texas Instruments(TI ) |
IC FULL ADDER 4BIT BIN 16-SOIC |
Consult |
|
|
|
SN74BCT8245ANT |
Texas Instruments(TI ) |
IC SCAN TEST DEVICE TXRX 24-DIP |
Consult |
|
|
|
SN74BCT8374ADWR |
Texas Instruments(TI ) |
IC SCAN TEST DEVICE W/FF 24-SOIC |
Consult |
|
|
|
SN74BCT8374ANTG4 |
Texas Instruments(TI ) |
IC SCAN TEST DEVICE W/FF 24-DIP |
Consult |
|
|
|
SSTU32864EC,518 |
NXP USA Inc. |
IC BUFFER 1.8V 25BIT SOT536-1 |
Consult |
|
|
|
SSTU32864EC,557 |
NXP USA Inc. |
IC BUFFER 1.8V 25BIT SOT536-1 |
Consult |
|
|
|
N74F283D,602 |
NXP USA Inc. |
IC BINARY FULL ADDER 4BIT 16SOIC |
Consult |
|
|
|
SSTU32864EC/G,551 |
NXP USA Inc. |
IC BUFFER 1.8V 25BIT SOT536-1 |
Consult |
|
|
|
SSTU32865ET,518 |
NXP USA Inc. |
IC BUFFER 1.8V 28BIT SOT802-1 |
Consult |
|
|
|
SSTU32866EC,557 |
NXP USA Inc. |
IC BUFFER 1.8V 25BIT SOT536-1 |
Consult |
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