| Data |
Photo |
Part No. |
Manufacturer |
Description |
Operate |
|
|
SN74LVT8980ADWR |
Texas Instruments(TI ) |
IC TEST-BUS CONTROLLER 24-SOIC |
Consult |
|
|
|
SN74LVT8996DWR |
Texas Instruments(TI ) |
IC 10-BIT SCAN PORT XCVR 24-SOIC |
Consult |
|
|
|
MC10E416FNR2G |
ON Semiconductor |
IC LINE RCVR QUINT DIFF 28-PLCC |
Consult |
|
|
|
MC100EP16TDTG |
ON Semiconductor |
IC RCVR/DRVR ECL DIFF 5V 8TSSOP |
Consult |
|
|
|
NB7VPQ16MMNHTBG |
ON Semiconductor |
IC CML DVR PRE-EMPH 1CH 16-QFN |
Consult |
|
|
|
SN74LVTH18504APMG4 |
Texas Instruments(TI ) |
IC SCAN-TEST-DEV/XCVR 64-LQFP |
Consult |
|
|
|
SN74LVTH18502APMG4 |
Texas Instruments(TI ) |
IC SCAN-TEST-DEV/XCVR 64-LQFP |
Consult |
|
|
|
MC100E116FNG |
ON Semiconductor |
IC LINE RECEIVER QUINT 28-PLCC |
Consult |
|
|
|
SN74LVT8980ADW |
Texas Instruments(TI ) |
IC TEST-BUS CONTROLLER 24-SOIC |
Consult |
|
|
|
NB100LVEP17MNR2G |
ON Semiconductor |
IC DRVR ECL QUAD 2.5V/3.3V 24QFN |
Consult |
|
|
|
SN74BCT8244ADW |
Texas Instruments(TI ) |
IC SCAN TEST DEVICE BUFF 24-SOIC |
Consult |
|
|
|
SN74BCT8244ADWE4 |
Texas Instruments(TI ) |
IC SCAN TEST DEVICE BUFF 24-SOIC |
Consult |
|
|
|
SN74ACT8997DW |
Texas Instruments(TI ) |
IC SCAN-PATH LINKER 28-SOIC |
Consult |
|
|
|
SN74ABT8646DLG4 |
Texas Instruments(TI ) |
IC SCAN TEST DEVICE 28-SSOP |
Consult |
|
|
|
SN74FB2033ARCRG3 |
Texas Instruments(TI ) |
IC REGISTERED TXRX 8BIT 52QFP |
Consult |
|
|
|
SN74ABT8996DW |
Texas Instruments(TI ) |
IC ADDRESSABLE SCAN PORT 24-SOIC |
Consult |
|
|
|
SN74ABTE16245DLG4 |
Texas Instruments(TI ) |
IC 16BIT I-WS BUS TXRX 48-SSOP |
Consult |
|
|
|
SN74ABT18245ADL |
Texas Instruments(TI ) |
IC SCAN-TEST-DEV/TXRX 56-SSOP |
Consult |
|
|
|
SN74ABT18504PMG4 |
Texas Instruments(TI ) |
IC SCAN TEST DEVICE 20BIT 64LQFP |
Consult |
|
|
|
SN74BCT8245ADW |
Texas Instruments(TI ) |
IC SCAN TEST DEVICE TXRX 24-SOIC |
Consult |
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