| 数据表 |
图片 |
型号 |
品牌 |
描述/封装 |
咨询 |
|
|
SN74LVT8980ADWRG4 |
Texas Instruments(TI ) |
IC TEST-BUS CONTROLLER 24-SOIC |
咨询 |
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SN74ABTE16245DLR |
Texas Instruments(TI ) |
IC 16BIT I-WS BUS TXRX 48-SSOP |
咨询 |
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|
SN74LVT8980ADWR |
Texas Instruments(TI ) |
IC TEST-BUS CONTROLLER 24-SOIC |
咨询 |
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|
SN74LVT8996DWR |
Texas Instruments(TI ) |
IC 10-BIT SCAN PORT XCVR 24-SOIC |
咨询 |
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MC10E416FNR2G |
ON Semiconductor |
IC LINE RCVR QUINT DIFF 28-PLCC |
咨询 |
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MC100EP16TDTG |
ON Semiconductor |
IC RCVR/DRVR ECL DIFF 5V 8TSSOP |
咨询 |
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NB7VPQ16MMNHTBG |
ON Semiconductor |
IC CML DVR PRE-EMPH 1CH 16-QFN |
咨询 |
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|
SN74LVTH18504APMG4 |
Texas Instruments(TI ) |
IC SCAN-TEST-DEV/XCVR 64-LQFP |
咨询 |
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SN74LVTH18502APMG4 |
Texas Instruments(TI ) |
IC SCAN-TEST-DEV/XCVR 64-LQFP |
咨询 |
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|
MC100E116FNG |
ON Semiconductor |
IC LINE RECEIVER QUINT 28-PLCC |
咨询 |
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SN74LVT8980ADW |
Texas Instruments(TI ) |
IC TEST-BUS CONTROLLER 24-SOIC |
咨询 |
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NB100LVEP17MNR2G |
ON Semiconductor |
IC DRVR ECL QUAD 2.5V/3.3V 24QFN |
咨询 |
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SN74BCT8244ADW |
Texas Instruments(TI ) |
IC SCAN TEST DEVICE BUFF 24-SOIC |
咨询 |
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SN74BCT8244ADWE4 |
Texas Instruments(TI ) |
IC SCAN TEST DEVICE BUFF 24-SOIC |
咨询 |
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SN74ACT8997DW |
Texas Instruments(TI ) |
IC SCAN-PATH LINKER 28-SOIC |
咨询 |
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SN74ABT8646DLG4 |
Texas Instruments(TI ) |
IC SCAN TEST DEVICE 28-SSOP |
咨询 |
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|
SN74FB2033ARCRG3 |
Texas Instruments(TI ) |
IC REGISTERED TXRX 8BIT 52QFP |
咨询 |
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SN74ABT8996DW |
Texas Instruments(TI ) |
IC ADDRESSABLE SCAN PORT 24-SOIC |
咨询 |
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|
|
SN74ABTE16245DLG4 |
Texas Instruments(TI ) |
IC 16BIT I-WS BUS TXRX 48-SSOP |
咨询 |
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|
|
SN74ABT18245ADL |
Texas Instruments(TI ) |
IC SCAN-TEST-DEV/TXRX 56-SSOP |
咨询 |
0755-82563580
