| 数据表 | 图片 | 型号 | 品牌 | 描述/封装 | 咨询 |
|---|---|---|---|---|---|
|
|
MC14007UBD | ON Semiconductor | IC COMP DUAL PAIR W/INV 14-SOIC | 咨询 |
|
|
|
SN74AS181ANT | Texas Instruments(TI ) | IC ARITHMETIC LOGIC UNIT 24DIP | 咨询 |
|
|
|
MC14490FG | ON Semiconductor | IC BOUNCE ELIMINATOR 16SOEIAJ | 咨询 |
|
|
|
SN74AS181ADWR | Texas Instruments(TI ) | IC ARITHMETIC LOGIC UNIT 24-SOIC | 咨询 |
|
|
|
SN74AS181ADWRE4 | Texas Instruments(TI ) | IC ARITHMETIC LOGIC UNIT 24-SOIC | 咨询 |
|
|
|
SN74BCT8244ANT | Texas Instruments(TI ) | IC SCAN TEST DEVICE BUFF 24-DIP | 咨询 |
|
|
|
SN74BCT8240ANT | Texas Instruments(TI ) | IC SCAN TEST DEVICE BUFF 24-DIP | 咨询 |
|
|
|
SN74BCT8374ANT | Texas Instruments(TI ) | IC SCAN TEST DEVICE W/FF 24-DIP | 咨询 |
|
|
|
SN74F283NSR | Texas Instruments(TI ) | IC FULL ADDER 4BIT BIN 16SO | 咨询 |
|
|
|
SN74F283DR | Texas Instruments(TI ) | IC FULL ADDER 4BIT BIN 16-SOIC | 咨询 |
|
|
|
SN74BCT8245ANT | Texas Instruments(TI ) | IC SCAN TEST DEVICE TXRX 24-DIP | 咨询 |
|
|
|
SN74BCT8374ADWR | Texas Instruments(TI ) | IC SCAN TEST DEVICE W/FF 24-SOIC | 咨询 |
|
|
|
SN74BCT8374ANTG4 | Texas Instruments(TI ) | IC SCAN TEST DEVICE W/FF 24-DIP | 咨询 |
|
|
|
SSTU32864EC,518 | NXP USA Inc. | IC BUFFER 1.8V 25BIT SOT536-1 | 咨询 |
|
|
|
SSTU32864EC,557 | NXP USA Inc. | IC BUFFER 1.8V 25BIT SOT536-1 | 咨询 |
|
|
|
N74F283D,602 | NXP USA Inc. | IC BINARY FULL ADDER 4BIT 16SOIC | 咨询 |
|
|
|
SSTU32864EC/G,551 | NXP USA Inc. | IC BUFFER 1.8V 25BIT SOT536-1 | 咨询 |
|
|
|
SSTU32865ET,518 | NXP USA Inc. | IC BUFFER 1.8V 28BIT SOT802-1 | 咨询 |
|
|
|
SSTU32866EC,557 | NXP USA Inc. | IC BUFFER 1.8V 25BIT SOT536-1 | 咨询 |
|
|
|
SSTU32866EC/G,518 | NXP USA Inc. | IC BUFFER 1.8V 25BIT SOT536-1 | 咨询 |
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